Quaigh: open source test pattern generation

From F-Si wiki
Jump to navigation Jump to search
  • Speakers: Gabriel Gouvine
  • email: gabriel.gouvine_quaigh@m4x.org



After building an electronic circuit, it is necessary to test it for physical defaults. This makes test pattern generation is a critical piece of a design-for-test toolchain. Its goal is to obtain a small number of test patterns that exercize all possible faults in a circuit.

Quaigh is a test pattern generation tool developed in Rust. In this presentation, we will present the test pattern generation and the tool, and discuss the experience of developing reusable EDA libraries in the Rust ecosystem.